00977nam a2200217 a 4500001001300000005001500013008004100028041001300069049003000082052002100112056001300133082001800146100004800164245029100212260003300503300003600536502009600572504003200668650004000700900001900740KDM20063416120200804141847060125s2005    ulkd       AE 000   eng  0 aengbkor0 lWM468363lWM468364c2fDP02a621.38152bG491n  a569.4240 a621.381522211 a김해택,g金海澤,d1971-0KAC20205745611a(A)novel opto-electronic characterization technique for interface states and model parameters in deep-submicron devices=x극미세 구조 반도체 소자의 계면상태 및 특성변수 추출을 위한 새로운 광-전 특성분석 방법과 그 응용에 관한 연구/d김해택  aSeoul:bKookmin Univ.,c2005  axi, 103 leaves:bcharts;c26 cm1 aThesis(Ph.D.) --bGraduate School, Kookmin Univ.,cDept. of Electronics Engineering,d2005.  aBibliography: leaves 88-94. 8a반도체[半導體]0KSH199800058110aKim, Hae-taek.