01407nam a2200301 c 4500001001300000005001500013008004100028040001100069041001300080052003100093245025200124300002300376545004300399545004300442545004300485545004700528653017000575700001900745700003600764700001400800700004800814773014500862856002001007900001901027900002401046900001801070900001701088KSI00023840020040714103448040622s1998    ulk           000   kor    a0110010 akorbeng01a530.7505b한519ㅂc18(3)00a소형 물체의 검사를 위한 고해상도 미세 초점 X선 단층 촬영 시스템=xHigh resolution computerized tomography system using the microfocus x-ray for inspection of small specimens/d김영주,e구자용,e이승석,e김환우  ap. 181-190;c26 cm  a김영주, 한국표준과학연구원  a구자용, 한국표준과학연구원  a이승석, 한국표준과학연구원  a김환우, 충남대학교 전자공학과  a소형물체a고해상도a미세초점aX선단층촬영시스템aX-rayaHigh resolutionaComputerizedaTomography systemaMicrofocusaInspectionaSmall specimens1 a김영주4aut1 a구자용,d1959-0KAC2017330971 a이승석1 a김환우,g金煥宇,d1954-0KAC2015198570 t비파괴검사학회지.d韓國非破壞檢査學會.g제18권 3호(1998년 6월), p. 181-190q18:3<181w(011001)KSE199508510,x1225-784240u1989795aKd00210aKim, Young-Joo10aKoo, Jayong,d1959-10aLee, Seung S.10aKim, Whan W.