01441nam a2200325 c 4500001001300000005001500013008004100028040001100069041001300080052003000093245025700123300003200380545005500412545005900467545004300526545003700569545005500606653009400661700001900755700001400774700003600788700003600824700003600860773012800896900001801024900001701042900001901059900002001078900001701098KSI00015551320040209194221031215s1995 ulka 000 kor  a0110010 akorbeng01a554.9405b한622ㅎc4(1)00a3 MeV $$ P^+$$이온주입된 실리콘의 열처리에 따른 X-ray Rocking Curve 분석=xX-ray rocking curve analysis of post-annealed 3 MeV $$ P^+$$ implanted silicon/d조남훈,e장기완,e김창수,e이정용,e노재상 ap. 109-117:b삽도;c26 cm a조남훈, 홍익대학교 금속·재료공학과 a장기완, 한국과학기술원 전자재료공학과 a김창수, 한국표준과학연구원 a이정용, 한국과학기술원 a노재상, 홍익대학교 금속·재료공학과 a이온주입a실리콘a열처리aX-ray Rocking curveaPost-annealedaImplanted silicon1 a조남훈4aut1 a장기완1 a김창수,d1958-0KAC2018473081 a이정용,d1951-0KAC2013292771 a노재상,d1956-0KAC2017216840 t韓國眞空學會誌.d韓國眞空學會.g4권 1호(1995년 3월), p. 109-117q4:1<109w(011001)KSE199508370,x1225-882210aCho, Nam-Hoon10aJang, Ki-Wan10aKim, Chang-Soo10aLee, Jeong-Yong10aRo, Jae-Sang